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electron-beam spot

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  • electron beam spot — elektronų pluošto dėmė statusas T sritis radioelektronika atitikmenys: angl. electron beam spot vok. Elektronenstrahlfleck, m rus. пятно электронного пучка, n pranc. tache du faisceau, f; tache du jet électronique, f …   Radioelektronikos terminų žodynas

  • Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… …   Wikipedia

  • Electron beam induced deposition — (EBID) is a process of decomposing gaseous molecules by electron beam leading to deposition of non volatile fragments onto a nearby substrate. Process Focused electron beam of scanning electron microscope (SEM) or scanning transmission electron… …   Wikipedia

  • Electron beam tomography — (EBT) is a specific form of computed axial tomography (CAT or CT) in which the X ray tube is not mechanically spun in order to rotate the source of X ray photons. This different design was explicitly developed to better image heart structures… …   Wikipedia

  • Electron microprobe — An electron microprobe (EMP), also known as an electron probe microanalyser (EPMA) is an analytical tool used to non destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron… …   Wikipedia

  • Electron gun — An electron gun (also called electron emitter) is an electrical component that produces an electron beam that has a precise kinetic energy and is most often used in televisions and monitors which use cathode ray tube technology, as well as in… …   Wikipedia

  • Environmental scanning electron microscope — Wool fibers imaged in an ESEM by the use of two symmetrical plastic scintillating backscattered electron detectors …   Wikipedia

  • Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs …   Wikipedia

  • Scanning Electron Microscopy — Microscopie électronique à balayage Pour les articles homonymes, voir MEB, SEM et Microscope. Microscope électronique à balayage JEOL JSM 6340F …   Wikipédia en Français

  • Scanning transmission electron microscopy — A scanning transmission electron microscope (STEM) is a type of transmission electron microscope. With it, the electrons pass through the specimen, but, as in scanning electron microscopy, the electron optics focus the beam into a narrow spot… …   Wikipedia

  • Laser beam welding — (LBW) is a welding technique used to join multiple pieces of metal through the use of a laser. The beam provides a concentrated heat source, allowing for narrow, deep welds and high welding rates. The process is frequently used in high volume… …   Wikipedia

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